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Scientific Information Resource Centre, NCRA-TIFR

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High-level test synthesis of digital VLSI circuits / by Lee, Mike Tien-Chien. Publication: Boston : Artech House, 1997 . xi, 220 p. : 24 cm. Date: 1997 Availability: Items available: National Centre for Radio Astrophysics General Stacks [621.3.049.77/LEE] (1),
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Digital systems testing and testable design / by Abramovici, Miron. Publication: New York : IEEE Press, 1990 . xviii, 652 p. : 27 cm. Date: 1990 Availability: Items available: Giant Metrewave Radio Telescope General Stacks (1),
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